X-Ray Mapping and Post Processing

X-Ray mapping and the mineralogy pattern of nickel laterite ore: Bavanat, Fars, Iran

According to the classification of the nickel laterite, this paper describes mineralogy test is to reveal where valuable elements are located in the ore, in which mineralogical form. The purpose of the sieving test was to study if some specific particle size contains most of the valuable metals. Based on its chemical composition nickel laterite is classified as a limonite type and the nickel an...

X-ray data processing

The method of molecular structure determination by X-ray crystallography is a little over a century old. The history is described briefly, along with developments in X-ray sources and detectors. The fundamental processes involved in measuring diffraction patterns on area detectors, i.e. autoindexing, refining crystal and detector parameters, integrating the reflections themselves and putting th...

The Mapping X - Ray Fluorescence Spectrometer ( Mapx

Thomas Bristow, Robert Downs, Marc Gailhanou, Franck Marchis, Douglas Ming, Richard Morris, Vicente Armando Solé, Kathleen Thompson, Philippe Walter, Michael Wilson, Albert Yen and Samuel Webb, NASA Ames Research Center, Moffett Field, CA [email protected], SETI Institute, Mountain View, CA, Univ. of Arizona, Tucson AZ, IM2NP, Université Paul Cézanne, Marseille, France, NASA Johnson Space Ce...

Mapping databases of X-ray powder patterns

Nano-structural Characterization of Post-annealed ZnO Thin Films by X-ray Diffraction and Field Emission Scanning Electron Microscopy

ZnO thin films were deposited on Si(400) substrates by e-beam evaporation technique, and then post-annealed at different annealing temperatures (200-800°C). Dependence of the crystallographic structure, nano-strain, chemical composition and surface physical Morphology of these layers on annealing temperature were studied. The crystallographic structure of films was studied using X-Ray Diffracti...